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MICROSCIENCE 2008: International Conference and Exhibition
[23-26 Jun 2008]

>> At the MICROSCIENCE Exhibition you will be able to see the latest advances in light microscopy, SEM, TEM, software and hardware for image processing, analysis and quantification, and specimen preparation equipment from a wide range of manufacturers and suppliers.

Nearly 100 companies will be exhibiting microscopes - light, confocal, electron or scanning probe - associated equipment or image analysis systems.

>> The MICROSCIENCE International Conference will boast three parallel sessions covering three inspiring themes over three days. These are:

Characterisation and nanofabrication of advanced materials
The cell in time and space
Microscopy and analysis at the frontiers

	Plenary Lectures
24th June	The 21st century challenges of sustainability and wellbeing Sir David King, Former Chief Scientific Advisor, UK Government
25th June	Aberration-corrected electron microscopy - a breakthrough for materials science in atomic dimensions Prof. Knut Urban, Research Centre Juelich, Germany
26th June	Breaking Abbe barrier: diffraction - unlimited resolution in far-field optical microscopy Prof. Stefan Hell