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Events20142010<Β>External Events - 2010May

SPIE Scanning Microscopy 2010
[17-19 May 2010]


>> SPIE Scanning Microscopy 2010, is a multidisciplinary forum that seeks to advance scanning microscopy technologies and applications. The conference for scientists and researchers to share ideas and find technical solutions, funding sources, and personal connections that help ensure their success. 

>> Topics: 

  • Particle Beam Microscopy
  • Forensics Microscopy
  • Scanned Probe Modeling
  • Optical Microscopy
  • Microscopy for Food Analysis
  • Biological Scanning Microscopy

>> Planned Workshops:

  • Desk Top SEM
  • Forensics
17-19 May 2010 


Portola Plaza
Two Portola Plaza
Monterey, CA
93940 USA



Contact
:


SPIE

Tel.: +1 360 676 3290
Fax:   +1 888 504 8171 
e-mail: customerservice@spie.org



[Organizer: SPIE]